Recent advances in PMOS negative bias temperature instability. - characterization and modeling of device architecture, material and process impact
- Författare
- (Souvik Mahapatra, editor.)
- Språk
- Engelska
| Förlag | År | Ort | Om boken | ISBN |
|---|---|---|---|---|
| Springer | 2022 | Singapore, Gateway East, Singapore | 1 online resource (322 pages) | 978-981-16-6120-4 |